[gcc r14-9137] AArch64: update vget_set_lane_1.c test output

[Tamar Christina <tnfchris@gcc.gnu.org>]

https://gcc.gnu.org/g:7d8585c0c0e5934780281abdee256ae6553e56e8

commit r14-9137-g7d8585c0c0e5934780281abdee256ae6553e56e8
Author: Tamar Christina <tamar.christina@arm.com>
Date:   Thu Feb 22 15:32:08 2024 +0000

    AArch64: update vget_set_lane_1.c test output
    
    In the vget_set_lane_1.c test the following entries now generate a zip1 instead of an INS
    
    BUILD_TEST (float32x2_t, float32x2_t, , , f32, 1, 0)
    BUILD_TEST (int32x2_t,   int32x2_t,   , , s32, 1, 0)
    BUILD_TEST (uint32x2_t,  uint32x2_t,  , , u32, 1, 0)
    
    This is because the non-Q variant for indices 0 and 1 are just shuffling values.
    There is no perf difference between INS SIMD to SIMD and ZIP on Arm uArches but
    preferring the INS alternative has a drawback on all uArches as ZIP being a three
    operand instruction can be used to tie the result to the return register whereas
    INS would require an fmov.
    
    As such just update the test file for now.
    
    gcc/testsuite/ChangeLog:
    
            PR target/112375
            * gcc.target/aarch64/vget_set_lane_1.c: Update test output.

Diff:
---
 gcc/testsuite/gcc.target/aarch64/vget_set_lane_1.c | 2 +-
 1 file changed, 1 insertion(+), 1 deletion(-)

diff --git a/gcc/testsuite/gcc.target/aarch64/vget_set_lane_1.c b/gcc/testsuite/gcc.target/aarch64/vget_set_lane_1.c
index 07a77de31920..a3978f68e4ff 100644
--- a/gcc/testsuite/gcc.target/aarch64/vget_set_lane_1.c
+++ b/gcc/testsuite/gcc.target/aarch64/vget_set_lane_1.c
@@ -22,7 +22,7 @@ BUILD_TEST (uint16x4_t, uint16x4_t, , , u16, 3, 2)
 BUILD_TEST (float32x2_t, float32x2_t, , , f32, 1, 0)
 BUILD_TEST (int32x2_t,   int32x2_t,   , , s32, 1, 0)
 BUILD_TEST (uint32x2_t,  uint32x2_t,  , , u32, 1, 0)
-/* { dg-final { scan-assembler-times "ins\\tv0.s\\\[1\\\], v1.s\\\[0\\\]" 3 } } */
+/* { dg-final { scan-assembler-times "zip1\\tv0.2s, v0.2s, v1.2s" 3 } } */
 
 BUILD_TEST (poly8x8_t, poly8x16_t, , q, p8, 7, 15)
 BUILD_TEST (int8x8_t,  int8x16_t,  , q, s8, 7, 15)