[PATCH] btf: improve btf-datasec-3.c test [PR 114642]

[PATCH] btf: improve btf-datasec-3.c test [PR 114642]

[David Faust]

This test failed on powerpc --target_board=unix'{-m32}' because two
variables were not placed in sections where the test silently (and
incorrectly) assumed they would be.

The important thing for the test is only that BTF_KIND_DATASEC entries
are NOT generated for the extern variable declarations without an
explicit section attribute.  Make the test more robust by placing the
non-extern variables in explicit sections, and invert the checks to
more accurately verify what we care about in this test.

Tested on x86_64-linux-gnu and x86_64-linux-gnu host for
powerpc64-linux-gnu and bpf-unkown-none targets.

OK?

gcc/testsuite/
	PR testsuite/114642
	* gcc.dg/debug/btf/btf-datasec-3.c: Make test more robust on different
	architectures.
---
 gcc/testsuite/gcc.dg/debug/btf/btf-datasec-3.c | 16 ++++++++--------
 1 file changed, 8 insertions(+), 8 deletions(-)

diff --git a/gcc/testsuite/gcc.dg/debug/btf/btf-datasec-3.c b/gcc/testsuite/gcc.dg/debug/btf/btf-datasec-3.c
index 297340cabfa..6b127aa14da 100644
--- a/gcc/testsuite/gcc.dg/debug/btf/btf-datasec-3.c
+++ b/gcc/testsuite/gcc.dg/debug/btf/btf-datasec-3.c
@@ -7,22 +7,22 @@
 
 extern int VERSION __attribute__((section (".version")));
 
-extern int test_bss1;
-extern int test_data1;
+extern int ext1;
+extern int ext2;
 
-int test_bss2;
-int test_data2 = 2;
+int var1 __attribute__((section (".sec_a")));
+int var2 __attribute__((section (".sec_b"))) = 2;
 
 int
 foo (void)
 {
-  test_bss2 = VERSION;
-  return test_bss1 + test_data1 + test_data2;
+  ext2 = VERSION;
+  return ext1 + var1 + var2;
 }
 
 /* There should be 3 DATASEC entries total.  Of the extern decls, only VERSION
    has a known section; entries are not created for the other two.  */
 /* { dg-final { scan-assembler-times "bts_type" 3 } } */
-/* { dg-final { scan-assembler-times "bts_type: \\(BTF_KIND_VAR 'test_data2'\\)" 1 } } */
-/* { dg-final { scan-assembler-times "bts_type: \\(BTF_KIND_VAR 'test_bss2'\\)" 1 } } */
 /* { dg-final { scan-assembler-times "bts_type: \\(BTF_KIND_VAR 'VERSION'\\)" 1 } } */
+/* { dg-final { scan-assembler-not "bts_type: \\(BTF_KIND_VAR 'ext1'\\)" } } */
+/* { dg-final { scan-assembler-not "bts_type: \\(BTF_KIND_VAR 'ext2'\\)" } } */
-- 
2.43.0

Re: [PATCH] btf: improve btf-datasec-3.c test [PR 114642]

[Indu Bhagat]

On 4/8/24 2:01 PM, David Faust wrote:
> This test failed on powerpc --target_board=unix'{-m32}' because two
> variables were not placed in sections where the test silently (and
> incorrectly) assumed they would be.
> 
> The important thing for the test is only that BTF_KIND_DATASEC entries
> are NOT generated for the extern variable declarations without an
> explicit section attribute.  Make the test more robust by placing the
> non-extern variables in explicit sections, and invert the checks to
> more accurately verify what we care about in this test.
> 
> Tested on x86_64-linux-gnu and x86_64-linux-gnu host for
> powerpc64-linux-gnu and bpf-unkown-none targets.
> 
> OK?
> 

Hi David,

LGTM.

I see that we have btf-datasec-1.c testcase for checking the case when 
vars are in sections .rodata/.bss/.data.

Thanks

> gcc/testsuite/
> 	PR testsuite/114642
> 	* gcc.dg/debug/btf/btf-datasec-3.c: Make test more robust on different
> 	architectures.
> ---
>   gcc/testsuite/gcc.dg/debug/btf/btf-datasec-3.c | 16 ++++++++--------
>   1 file changed, 8 insertions(+), 8 deletions(-)
> 
> diff --git a/gcc/testsuite/gcc.dg/debug/btf/btf-datasec-3.c b/gcc/testsuite/gcc.dg/debug/btf/btf-datasec-3.c
> index 297340cabfa..6b127aa14da 100644
> --- a/gcc/testsuite/gcc.dg/debug/btf/btf-datasec-3.c
> +++ b/gcc/testsuite/gcc.dg/debug/btf/btf-datasec-3.c
> @@ -7,22 +7,22 @@
>   
>   extern int VERSION __attribute__((section (".version")));
>   
> -extern int test_bss1;
> -extern int test_data1;
> +extern int ext1;
> +extern int ext2;
>   
> -int test_bss2;
> -int test_data2 = 2;
> +int var1 __attribute__((section (".sec_a")));
> +int var2 __attribute__((section (".sec_b"))) = 2;
>   
>   int
>   foo (void)
>   {
> -  test_bss2 = VERSION;
> -  return test_bss1 + test_data1 + test_data2;
> +  ext2 = VERSION;
> +  return ext1 + var1 + var2;
>   }
>   
>   /* There should be 3 DATASEC entries total.  Of the extern decls, only VERSION
>      has a known section; entries are not created for the other two.  */
>   /* { dg-final { scan-assembler-times "bts_type" 3 } } */
> -/* { dg-final { scan-assembler-times "bts_type: \\(BTF_KIND_VAR 'test_data2'\\)" 1 } } */
> -/* { dg-final { scan-assembler-times "bts_type: \\(BTF_KIND_VAR 'test_bss2'\\)" 1 } } */
>   /* { dg-final { scan-assembler-times "bts_type: \\(BTF_KIND_VAR 'VERSION'\\)" 1 } } */
> +/* { dg-final { scan-assembler-not "bts_type: \\(BTF_KIND_VAR 'ext1'\\)" } } */
> +/* { dg-final { scan-assembler-not "bts_type: \\(BTF_KIND_VAR 'ext2'\\)" } } */
>